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SNJ54BCT8374AFK
Part number：
SNJ54BCT8374AFK
CLASSIFICATION：
Integrated Circuits (ICs)
manufacturer：
Texas Instruments
describe：
SCAN TEST DEVICES WITH OCTAL D-T
package：
ROHS status：
Yes
currency：
USD
PDF:
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inventory 1600
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specifications
  • Package / Case
    28-CLCC
  • Mounting Type
    Surface Mount
  • Number of Bits
    8
  • Logic Type
    Scan Test Device with D-Type Edge-Triggered Flip-Flops
  • Operating Temperature
    -55°C ~ 125°C
  • Supply Voltage
    4.5V ~ 5.5V
  • Supplier Device Package
    28-LCCC (11.43x11.43)
  • 924502482
  • 13620209915
  • 86 13620209915
  • elena-ys@aliyun.com

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